Hall Probes
SENIS Hall Probes Product Matrix
This product matrix provides a structured comparison of SENIS Hall Probe families, helping users evaluate the key differences in probe size, distance to field-sensitive volume, transducer compatibility, mapper support, package robustness, operating temperature, accuracy, resolution, and bandwidth.
The SENIS Hall Probe series covers a wide range of magnetic field measurement applications, including robust industrial measurement, thin and long probe access, naked Si chip sensing, closest-distance measurement to magnets, sliding contact measurement, ultra-high-resolution undulator applications, cryogenic 3D Hall measurement, and ultra-thin air-gap magnetic field measurement.
The C Probe is suitable for compact and robust general-purpose magnetic field measurement. The H Probe is a thin and long probe designed for narrow spaces and mapping applications. The K / L Probes use thin naked Si chip structures for applications requiring minimal distance to the magnetic field source. The SP Probe is optimized for closest-distance measurement to magnets. The A Probe provides a robust package for industrial environments. The SHP Probe is designed for sliding contact measurement. The S Probe targets ultra-high-resolution undulator applications. The K3A-P/C Probe is suitable for cryogenic 3D Hall measurements down to 1K, while the AGP Probe is designed for ultra-thin magnetic field measurement in air gaps as small as 0.5 mm.